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Updated: Jul 7, 2025

Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging
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Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging

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自由电子拉姆齐型干扰计用于增强近场的振幅和相位成像

Tomer Bucher1,2, Ron Ruimy1,2, Shai Tsesses1,3

  • 1Andrew and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa 3200003, Israel.

Science advances
|December 22, 2023
PubMed
概括

这项研究引入了一种算法显微镜方法,可以显著提高光子诱导近场电子显微镜 (PINEM) 的灵敏度和相位重建能力. 这种进步使得即使在敏感样本中,也可以对封闭的电场进行优越的成像.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The probe is regarded as the heart of any AFM setup and comprises the...
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