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金属矩阵复合材料的定量相位对比X射线断层扫描

Ashish K Agrawal¹, Chiradeep Gupta², Balwant Singh¹

¹Technical Physics Division, Bhabha Atomic Research Centre, Mumbai, India; Homi Bhabha National Institute, Mumbai, 400 094, India.

Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine

|December 22, 2023

概括

基于单一图像的相位检索改进了对Al-SiC金属矩阵复合材料 (MMC) 的X射线微断层扫描. 帕加宁方法最好地增强对比度,用于评估SiC颗粒和损伤.

科学领域:

材料科学材料科学材料科学
复合材料复合材料复合材料
非破坏性测试不破坏性测试

背景情况:

对Al-SiC金属矩阵复合材料 (MMC) 微结构和损伤的定量评估对于设计和性能至关重要.
X射线相位对比微图解提供3D微结构分析,但受到Al矩阵和SiC粒子之间的差异的影响.
不够的对比度阻碍了MMC特征的清晰形态识别和定量评估.

研究的目的:

提出并应用基于单一图像的相位检索作为微观断层重建的预处理步骤.
加强对Al-SiC MMC微结构和凝聚力损害的评估.
评估不同阶段检索技术在提高图像质量和量化方面的有效性.

主要方法:

在微观断层图像重建之前,应用基于单一图像的相位检索技术.
使用X射线相位对比微断层扫描来进行3D微结构分析.
用于图像增强和量化各种相位检索方法的比较.

主要成果:

阶段检索显著改善了Al-SiC MMC微结构分析的图像质量.
帕加宁方法在对比度和噪声比率方面表现出最好的改善.
增强的对比度有助于精确测量SiC颗粒,毛孔和凝聚力损伤.

结论:

基于单一图像的相位检索是Al-SiC MMC的X射线微断层扫描的有效预处理步骤.
建议使用帕加宁方法,以优化SiC颗粒和损伤评估.
改进的定量评估使得MMC的设计优化和结构与属性相关性更好.

关键词:

这是一种Al-SiCC.整体图形 (holotomography) 是一个全息图形.金属矩阵复合材料的复合材料阶段检索恢复阶段检索同步机同步机同步机.在 μCTCT 中.

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