一个新的SiC沟MOSFET,具有自我调整的N型离子植入技术
Baozhu Wang1,2, Hongyi Xu1,2, Na Ren2,3
1School of Micro-Nano Electronics, Zhejiang University, Hangzhou 310027, China.
Micromachines
|December 23, 2023
概括
这项研究引入了一种新型的碳化 (SiC) 自调整的N型离子植入沟沟MOSFET (NITMOS) 装置. 新设计通过减少电场,改善开关速度和功率损耗来提高性能.
科学领域:
- 半导体设备物理学 半导体设备物理
- 动力电子产品的动力电子.
- 材料科学是一种材料科学.
背景情况:
- 碳化 (SiC) MOSFET对于高功率应用至关重要.
- 现有的SiC沟MOSFET面临着电场管理和切换损失的挑战.
研究的目的:
- 提出和分析一种新的SiC自我调整的N型离子植入沟MOSFET (NITMOS) 装置.
- 调查关键结构参数对设备性能的影响.
- 将拟议的NITMOS设备与现有的SiC双槽MOSFET进行比较.
主要方法:
- 我们使用数值模拟来研究设备物理.
- 分析了沟侧壁和N植入区域之间的侧面间距 (Wsp) 的影响.
- 评估了关键性能指标,包括电场,特定电阻,门到排水电容和门到排水电荷.
主要成果:
- 引入P-epi层有效地降低了门氧化物的最大电场到3 MV/cm以下.
- 增加横间距 (Wsp) 提高了短路能力,降低了门到排水电容 (Cgd) 和电荷 (Qgd).
- 与SiC双沟MOSFET相比,最优的SiC NITMOS装置显示了Cgd (79%),Qgd (38%) 和Qgd × Ron,sp (41%) 的显著降低.
结论:
- 拟议的SiC NITMOS设备为高性能功率电子提供了一个有前途的解决方案.
- 该设计可实现更高的开关速度和更低的开关损失.
- 优化侧面间距 (Wsp) 对于实现卓越的设备特性至关重要.
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