在热循环下的热电模块的界面裂增长基于疲劳寿命预测
Yuqian Zhang1, Hailong He1, Chunping Niu1
1State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, 28 Xianning West Road, Xi'an, Shaanxi 710049, People's Republic of China.
ACS applied materials & interfaces
|December 28, 2023
概括
预测甲化物 (Bi2Te3) 热电 (TE) 模块的寿命是一项挑战. 这项研究开发了一种使用循环热应力和接口裂纹的模型,以准确预测TE模块的寿命和电阻的增加.
科学领域:
- 材料科学 材料科学 材料科学
- 机械工程 机械工程
- 可靠性工程可靠性工程
背景情况:
- 热电 (TE) 模块的寿命评估是复杂的和不发达的.
- 循环热应力可以导致接口裂,导致TE模块故障.
研究的目的:
- 开发一个基于Bi2Te3的TE模块寿命的预测模型.
- 分析周期性热应力对接口裂纹和模块退化影响.
主要方法:
- 使用安安德材料模型描述了接层粘性可塑性.
- 模拟的接口裂纹启动和传播与达尔沃模型和粘性塑料散散能量.
- 综合热循环实验和有限元模拟数据.
主要成果:
- 建立了TE模块的完整生命周期预测模型.
- 实现了阻力上升周期数的6.1%和其上升率的6.7%的预测偏差.
- 通过实验和模拟数据验证模型的可行性.
结论:
- 开发的模型提供了一个简单而有效的方法来预测TE模块的寿命.
- 这项研究为TE模块的生命周期评估提供了宝贵的见解.
- 这些发现有助于提高TE设备的可靠性和寿命.
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