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线性波数扫描源基于光学连贯性断层扫描光学连贯性断层扫描光学光学设备
Optics express
|January 5, 2024
概括
我们开发了一种高性能线性波数扫描源 (k-SS) 用于光学连贯断层扫描 (OCT). 这一进步可以实现实时成像,而无需重新采样数据,从而提高了OCT系统的性能.
科学领域:
- 生物医学光学 生物医学光学
- 激光物理 激光物理
- 光学工程是指光学工程.
背景情况:
- 传统的扫描源光学连贯性断层扫描 (SS-OCT) 需要重新采样数据,使实时成像复杂化.
- 一个线性波数扫描源 (k-SS) 可以消除这个重新采样步骤,提高成像速度和质量.
研究的目的:
- 介绍和描述一个高性能线性波数扫描源 (k-SS).
- 在SS-OCT系统中展示k-SS的实际应用.
主要方法:
- 在Littrow配置中使用基于声光调制器的外部腔激光二极管.
- k-SS的特点是线性,扫描范围,输出功率,线宽和扫描速率.
- 应用k-SS来测量样本分布,而不需要重新采样k-domain.
主要成果:
- 在1.3μm区域内,k-SS表现出强烈的线性 (R2 = 0.9998).
- 关键性能指标包括120nm扫描范围,>43mW输出功率,~1.6nm线宽和280Hz扫描速率.
- 在没有重新采样的情况下在SS-OCT成像中取得了成功的应用.
结论:
- 开发的线性k-SS提供了高性能,适用于先进的OCT应用.
- 这项技术具有显著的潜力,可以改善实时,高质量的SS-OCT成像.
- 消除k-域重新采样简化了OCT系统处理,提高了效率.
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