缓解电磁脉冲干扰森抛物线离子谱仪在XG-III激光设施的电磁脉冲
Zihao Li1, Ning Kang2,3, Jian Teng4
1School of Materials and Energy, University of Electronic Science and Technology of China, Chengdu 611731, China.
The Review of scientific instruments
|January 10, 2024
概括
来自高功率激光器的强烈电磁脉冲 (EMP) 可以损坏敏感设备. 屏蔽设计,包括金属和吸收材料,有效地减少激光设施中的EMP.
科学领域:
- 物理 物理学 物理
- 激光与等离子体相互作用
- 电磁学 电磁学 电磁学 电磁学
背景情况:
- 高功率激光系统产生强烈的电磁脉冲 (EMP),对森抛物线离子光谱仪等敏感诊断仪器构成威胁.
- 这些EMP源于高功率激光与固体目标的相互作用,为大型激光设施的实验设置带来了挑战.
研究的目的:
- 设计和评估Thomson抛物线离子光谱仪对强烈EMP的电磁屏蔽策略.
- 为了研究金属屏蔽子和额外的保护措施在激光设施内减轻EMP的有效性.
主要方法:
- 采用1毫米孔径的金属屏蔽来屏蔽森抛物线离子光谱仪.
- 进行了模拟,以评估子对电磁波的屏蔽效果.
- 分析了激光加速的相对论电子对屏蔽环境中的EMP产生的影响.
- 引入了一个墙和一个电磁吸收材料 (ECCOSORB AN-94),以进一步减少电子传播.
主要成果:
- 屏蔽将内部最大的EMP振幅降低到5.2kV/m.
- 模拟证实了子在屏蔽电磁波方面的有效性.
- 从子表面逃逸的相对论电子的电荷积累被确定为检测到EMP的来源.
- 添加一个墙和吸收材料显著阻断了电子的传播,进一步减轻EMP.
结论:
- 多层屏蔽方法,包括金属,墙和吸收材料,可以有效地减轻高功率激光环境中的EMP.
- 了解相对论电子的作用对于设计强大的电磁屏蔽解决方案至关重要.
- 这些发现为大型激光基础设施的电磁屏蔽设计提供了基础的见解.
更多相关视频
相关概念视频
Atomic Emission Spectroscopy: Interference
192
In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
192
Atomic Emission Spectroscopy: Instrumentation
474
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
474
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences
474
Inductively coupled plasma–mass spectrometry (ICP–MS) is a highly selective and sensitive technique for accurate elemental analysis. Though the analysis of ICP–MS mass spectra is comparatively straightforward, it is affected by spectroscopic and non-spectroscopic interferences. Spectroscopic interferences arise when the plasma contains ionic species with an m/z value the same as the analyte ion. Spectroscopic interference can be categorized as isobaric, polyatomic ions, and...
474


