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Updated: Jul 5, 2025

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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使用扫描白光干扰仪同时测量聚变折射率分散和化的厚度

Heesu Lee1, Seungjin Hwang2, Hong Jin Kong3,4

  • 1Department of Computer Science and Electrical Engineering, Handong Global University, Pohang 37554, Republic of Korea.

Sensors (Basel, Switzerland)
|January 11, 2024
PubMed
概括

这项研究精确地测量了化.

关键词:
化的二氧化.组折射指数分散的折射指数分散扫描白光干扰仪扫描白光干扰仪厚度 厚度 的 厚度.白光干扰仪的使用方法

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