高精度时间测量电子设备使用带通采样方法
Yichun Fan1,2, Lei Zhao1,2, Jiajun Qin1,2
1State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China.
The Review of scientific instruments
|January 19, 2024
概括
本研究提出了一种新的带宽采样方法,用于使用较低的采样率进行高精度的时间测量. 开发的系统实现了典型的RMS精度,比0.4皮秒更好,进步了计时电子.
科学领域:
- 电气工程 电气工程
- 信号处理 信号处理
- 仪器化 仪器化 仪器化
背景情况:
- 高精度的时间测量在各种科学和工程领域至关重要.
- 传统方法通常需要非常高的采样率 (每秒千兆样),增加硬件复杂性和成本.
- 有越来越多的研究兴趣在较低的采样率实现高时刻精度.
研究的目的:
- 开发一种能够在较低的采样速率 (约100 MSps) 上实现高精度的时间测量系统.
- 调查带宽采样的应用,以提高计时精度.
- 设计和实施适用于低采样率系统的实时时间提取算法.
主要方法:
- 一个模拟前端电路被设计用于带宽过和输入脉冲信号的放大.
- 开发了一个管道实时时间提取算法,结合了插值和交叉相关技术.
- 为了高效的交叉相关计算,使用了1024点的快速里叶变换 (FFT).
- 在一个中程现场可编程网关阵列 (FPGA) 上实现了四个时间测量通道.
主要成果:
- 该系统成功地实现了高精度的时间测量,采样速率约为100 MSps.
- 通过FPGA实现,实现了116kHz的测量速率.
- 计时系统的典型根正方形 (RMS) 精度被证明比0.4皮秒更好.
结论:
- 带宽采样方法是有效的实现高精度的时间测量在减少的采样率.
- 开发的实时算法和FPGA实现为高级计时应用提供了实用的解决方案.
- 实现的分比秒精度为更具成本效益和可访问的高分辨率计时系统开辟了可能性.
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