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阅读反场效应晶体管的操作机制,具有近非易失性记忆状态
Juhee Jeon1, Kyoungah Cho1, Sangsig Kim1
1Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of Korea.
Nanomaterials (Basel, Switzerland)
|January 22, 2024
概括
分析了带有准非挥发性内存状态的反场效应晶体管 (FBFET). 读脉冲影响了潜在的障碍和载体积累,使得记忆状态的非破坏性读取成为可能.
科学领域:
- 半导体设备物理学的物理
- 固态电子产品的固态电子
- 记忆设备技术 记忆设备技术
背景情况:
- 反场效应晶体管 (FBFET) 提供了准非易失性内存的潜力.
- 了解读取操作对于设备的性能和可靠性至关重要.
研究的目的:
- 分析具有准非挥发性内存状态的FBFET的读取操作机制.
- 研究读取脉冲对潜在障碍物和载体积累的影响.
- 探索FBFET内存状态的非破坏性读取特征.
主要方法:
- 使用设备模拟来分析FBFET读取操作.
- 分析包括检查潜在的屏障形成和载体积累动态.
- 交叉点电压和电流密度被用来描述内存状态.
主要成果:
- 写出脉冲 (40 ns) 创建了潜在的障碍和载体积累,定义了内存状态 (状态1/状态0).
- 阅读脉冲 (40 ns) 具有3秒的保留时间被用来读取这些状态.
- 读取脉冲影响了潜在的屏障形成和载体积累,影响了记忆读取.
- FBFETs显示了非破坏性的读取能力,取决于读取电压和脉冲宽度.
结论:
- 这项研究阐明了FBFET中准非易失性内存的读取操作机制.
- 通过读取电压和脉冲宽度可以实现和控制非破坏性读取.
- 设备模拟为FBFET内存状态动态提供了宝贵的见解.
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