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相关概念视频

Distribution Reliability and Automation01:25

Distribution Reliability and Automation

107
Distribution reliability in electrical power systems is critical for ensuring an uninterrupted power supply to consumers at minimal cost. According to IEEE Standard Terms, reliability is the probability that a device will function without failure over a specified time period or amount of usage. For electric power distribution, this translates to maintaining continuous power supply and addressing customer concerns over power outages. Several indices, as defined by IEEE Standard 1366-2012, are...
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Routh-Hurwitz Criterion II01:19

Routh-Hurwitz Criterion II

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In the application of the Routh-Hurwitz criterion, two specific scenarios can arise that complicate stability analysis.
The first scenario occurs when a singular zero appears in the first column of the Routh table. This situation creates a division by zero issues. To resolve this, a small positive or negative number, denoted as epsilon (∈), is substituted for the zero. The stability analysis proceeds by assuming a sign for ∈. If ∈ is positive, any sign change in the first...
252
Routh-Hurwitz Criterion I01:15

Routh-Hurwitz Criterion I

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Consider an electrical power grid, where stability is essential to prevent blackouts. The Routh-Hurwitz criterion is a valuable tool for assessing system stability under varying load conditions or faults. By analyzing the closed-loop transfer function, the Routh-Hurwitz criterion helps determine whether the system remains stable.
To apply the Routh-Hurwitz criterion, a Routh table is constructed. The table's rows are labeled with powers of the complex frequency variable s, starting from the...
246
Design Consideration01:22

Design Consideration

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Designing a structure involves a series of considerations, primarily the material's ultimate strength, calculated through tests that measure changes under increased force until the material reaches its breaking point or limit. The ultimate load, where the material breaks, is divided by its original cross-sectional area, resulting in the ultimate normal stress or strength. The ultimate shearing stress is another significant factor taken into account.
The factor of safety is another key...
187
Multimachine Stability01:25

Multimachine Stability

163
Multimachine stability analysis is crucial for understanding the dynamics and stability of power systems with multiple synchronous machines. The objective is to solve the swing equations for a network of M machines connected to an N-bus power system.
In analyzing the system, the nodal equations represent the relationship between bus voltages, machine voltages, and machine currents. The nodal equation is given by:
163
Line Protection with Impedance Relays01:27

Line Protection with Impedance Relays

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Coordinating time-delay overcurrent relays in complex radial systems and directional overcurrent relays in multi-source transmission loops can be challenging. Impedance relays address these issues by responding to the voltage-to-current ratio, specifically measuring the apparent impedance of a line. These relays become more sensitive during faults as current increases and voltage decreases, thereby reducing the apparent impedance.
Under normal conditions, low load currents keep the measured...
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相关实验视频

Updated: Jul 5, 2025

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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基于逻辑解决的方法,用于有效的可靠性分析.

Zhengguang Tang1, Cong Li1, Hailong You1

  • 1School of Microelectronics, Xidian University, Xi'an 710071, China.

Micromachines
|January 23, 2024
PubMed
概括
此摘要是机器生成的。

这项研究引入了一种改进的方法来分析数字电路的老化效应,提高准确性和速度. 它解决了设备老化的依赖性,以防止性能下降并确保可靠性.

关键词:
偏差温度不稳定性 (BTI)可靠性模拟加速加速的可靠性静态时间分析分析.压力概率评估压力概率评估

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科学领域:

  • 电气工程 电气工程
  • 计算机工程 计算机工程
  • 材料科学 材料科学 材料科学

背景情况:

  • 深度纳米级CMOS技术的扩展加剧了设备老化效应,降低了电路性能,并可能导致功能故障.
  • 可靠性意识的电路分析对于评估老化的影响至关重要,但现有的方法忽视了设备老化的依赖性,导致不准确的退化评估.
  • 精确的应力分析对于预测和减轻现代集成电路老化的影响至关重要.

研究的目的:

  • 为可靠性意识的静态定时分析提出改进的分析方法,以考虑设备老化依赖.
  • 为了提高数字电路中衰老路径延迟评估的准确性.
  • 为了减少衰老时间评估中的悲观主义,并尽量减少衰老意识合成流中的性能牺牲.

主要方法:

  • 建议采用逻辑解析的改进分析方法来解决设备老化依赖.
  • 该方法的重点是提高可靠性意识的静态时间分析的准确性.
  • 实验验证将拟议的方法与传统策略和精确的SPICE模拟进行比较.

主要成果:

  • 与传统策略相比,拟议的方法在评估衰老路径延迟方面表现出更高的准确性.
  • 过度悲观的衰老时间评估是减少的.
  • 与SPICE模拟相比,只有0.56%的相对误差实现了显著的378倍加速度.
  • 在老化意识的合成流中,电路性能牺牲是减少的.

结论:

  • 拟议的分析方法显著提高了深纳米级CMOS电路的可靠性意识静态定时分析的准确性和效率.
  • 通过考虑设备老化的依赖性,该方法提供了更可靠的降解评估,并减少了悲观情绪.
  • 高效率和精度使该方法适用于大规模的数字电路可靠性分析,满足速度需求,同时保持晶体管级模拟精度.