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Updated: Jul 4, 2025

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实验研究ZnO:Ga晶体在MeV电子束下快速闪的行为

Xiaoding Zhang1, Xiaoguo Jiang1, Yiding Li1

  • 1Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang, Sichuan Province 621900, China.

The Review of scientific instruments
|January 26, 2024
PubMed
概括

研究人员研究了ZnO:Ga晶体的闪特性. 一个晶体显示了超短,1.5纳秒的余光,表明了诊断高频电子束列车的潜力.

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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