基于石英调音叉的力传感器的振荡幅度的校准,使用位位显微镜
Bi-Qin Zhang1, Fei-Cen Ma1, Jia-Nan Xu1
1College of Chemistry and Chemical Engineering, Lanzhou University, Lanzhou 730000, People's Republic of China.
The Review of scientific instruments
|January 29, 2024
概括
我们开发了带位显微镜,用于精确校准原子力显微镜传感器. 这种方法实现了皮科米特灵敏度,提高了尖端样本相互作用力测量的准确性.
科学领域:
- 原子力显微镜 原子力显微镜
- 扫描探头显微镜 扫描探头显微镜
- 纳米级科学科学 纳米级科学
背景情况:
- 石英调叉和qPlus传感器为尖端样本相互作用研究提供了支柱的替代方案.
- 这些传感器的高质量系数 (Q) 和刚度可以防止尖端样本接触问题.
- qPlus传感器可以同时扫描道和原子力显微镜以获得亚原子分辨率.
研究的目的:
- 开发一种准确校准原子力显微镜传感器弹常数和振荡幅度的方法.
- 为了提高对尖端样本相互作用力测量的信心.
主要方法:
- 开发了带位移位显微镜.
- 为测量实现了皮科米特灵敏度.
主要成果:
- 为基于qPlus的力传感器引入了一种新的校准技术.
- 在位移测量中表现出皮科米级精度.
结论:
- 位位移显微镜为校准qPlus传感器提供了一种可靠的方法.
- 这种技术对于扫描探针显微镜中精确的尖端样本相互作用力测量至关重要.
相关概念视频
01:06Forced Oscillations
When an oscillator is forced with a periodic driving force, the motion may seem chaotic. The motions of such oscillators are known as transients. After the transients die out, the oscillator reaches a steady state, where the motion is periodic, and the displacement is determined.
01:08Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...