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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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相关实验视频

Updated: Jul 4, 2025

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy iPALM

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy iPALM

Published on: December 1, 2016

适应式干扰度粒子成像液态镜头.

Alexis Abad, Saïd Idlahcen, Mohamed Talbi

|January 31, 2024

概括

这项研究引入了一个自适应式干扰度粒子成像系统,使用液态透镜实时调整成像条件. 该系统在不同的条件下使用可编程和真实粒子进行有效的粒子成像.

科学领域:

流体动力学流体动力学
光学成像系统的光学成像系统.
粒子的表征粒子的表征

背景情况:

干涉度粒子成像 (IPI) 是用于粒子大小和速度测量的强大技术.
传统的IPI系统通常需要手动调整以获得最佳的成像,从而限制了实时的适应性.
在现场控制成像参数对于动态粒子分析至关重要.

研究的目的:

开发一种能够实时调整成像参数的自适应式干扰度粒子成像系统.
通过模拟和真实粒子场来证明系统的能力.
在IPI中验证液态镜头用于动态失焦控制的使用.

主要方法:

一个自适应式干扰度粒子成像系统是使用电压控制液态镜头设计的.
系统的失焦参数通过调节应用电压即可即时调整.
该设置使用来自数字微镜装置 (DMD) 的可编程粗颗粒,然后在纳米秒脉冲照明下使用真正的玻璃颗粒进行了验证.

主要成果:

液态镜头可以立即调整失焦参数,允许实时修改成像条件.
通过可编程粒子证明了成功的自适应成像,展示了系统的灵活性.
该系统有效地成像了真实的玻璃颗粒,证实了其在实际场景中的适用性.

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Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution

Published on: August 16, 2012

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

相关实验视频

Last Updated: Jul 4, 2025

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy iPALM

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy iPALM

Published on: December 1, 2016

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution

Published on: August 16, 2012

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

结论:

开发的自适应IPI系统通过液态镜头技术实时控制成像参数.
这一进步有助于在复杂或不断变化的环境中实现动态和高效的粒子成像.
该系统显示了需要适应性光学测量的应用的巨大潜力.