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相关概念视频

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

9.1K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
9.1K
Focusing of Light in the Eye01:16

Focusing of Light in the Eye

2.8K
Light rays enter the eye through the cornea, a transparent dome-shaped tissue that is the eye's outermost layer. The cornea bends or refracts, light rays traveling to the pupil. The shape of the cornea determines how much of the light is bent and whether the image will be focused correctly on the retina at the back of the eye. Once the light has passed through both refraction layers, it converges into a single focal point onto a small area. This is where photoreceptors start transforming...
2.8K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

5.5K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
5.5K
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

7.0K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
7.0K
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

13.3K
Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
13.3K

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相关实验视频

Updated: Jul 4, 2025

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

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深度聚焦:用于电子显微镜的快速聚焦和正.

P J Schubert1, R Saxena1, J Kornfeld2

  • 1Max Planck Institute for Biological Intelligence, Martinsried, 82152, Germany.

Nature communications
|January 31, 2024
PubMed
概括

我们开发了DeepFocus,这是一种基于数据的方法,用于扫描电子显微镜 (SEM) 中的偏差校正. 这种方法提高了图像质量,缩短了处理时间,并且可以轻松适应各种SEM应用.

科学领域:

  • 显微镜的使用方法
  • 数据科学数据科学数据科学

背景情况:

  • 高通量扫描电子显微镜 (SEM) 需要自动化,高质量的成像.
  • 目前的焦点和正方法往往不可靠,需要专家校准.

研究的目的:

  • 引入DeepFocus,这是一个新的,基于数据的方法,用于SEM中的偏差校正.
  • 在可用性和可靠性方面克服传统方法的局限性.

主要方法:

  • 开发了一种纯数据驱动的算法,名为DeepFocus,用于纠正偏差.
  • 在SEM数据集上训练并验证了该方法,重点关注低信号噪声条件.

主要成果:

  • 深度焦点可以在最小的人类干预下实现高图像质量.
  • 与现有方法相比,显著减少了处理时间 (超过10倍).
  • 在广泛的异常和重新校准的容易度中展示了快速的融合.

结论:

  • DeepFocus提供了一个强大的,高效的,用户友好的解决方案,用于SEM中的偏差校正.
  • 该方法可以适应不同的显微镜和具有挑战性的成像场景.
  • 通过改进的自动化实现更可靠的高通量显微镜.

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相关实验视频

Last Updated: Jul 4, 2025

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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Conducting Multiple Imaging Modes with One Fluorescence Microscope
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Conducting Multiple Imaging Modes with One Fluorescence Microscope

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