相关实验视频

Updated: Jul 4, 2025

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
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Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

Published on: December 8, 2016

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超紧的镜子装置,用于形成20纳米无色软X射线聚焦向多模式和多色纳米分析

Takenori Shimamura1,2,3, Yoko Takeo4,5, Fumika Moriya6

  • 1School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo, 113-8656, Japan. tshimamura@issp.u-tokyo.ac.jp.

Nature communications
|February 7, 2024
PubMed
概括

研究人员开发了一种超紧的柯克帕特里克-贝兹 (ucKB) 镜子,用于先进的纳米级软X射线显微镜. 这项创新使宽带X射线的高性能纳米聚焦成为可能,提高了成像灵敏度和多式联络分析能力.

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating10:39

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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