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Updated: Jul 4, 2025

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从4D-STEM前置电子衍射数据的高精度定向映射,通过对衍射强度的定量分析来实现.

Leonardo M Corrêa1, Eduardo Ortega2, Arturo Ponce2

  • 1Instituto de Fisica "Gleb Wataghin", Universidade Estadual de Campinas-UNICAMP, 13083-859 Campinas, SP, Brazil.

Ultramicroscopy
|February 8, 2024
PubMed
概括

使用4D-STEM的扫描传输电子显微镜 (STEM) 可提供高分辨率材料分析. 这项研究使用前置电子衍射 (PED) 在InP纳米线中实现了卓越的晶体定向精度,优于传统方法.

关键词:
在4D-STEM中,自动化晶体定向映射绘制埃舍尔比扭曲的纳米线.高角度分辨率的晶体方向测量测量前置电子衍射的偏光变化是前置的.对电子衍射强度的定量分析.

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