相关实验视频

Updated: Jul 13, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

11.8K

在多晶Cu层中对Si的纳米级原子运动的描述

Viktor Takáts1, Eszter Bodnár1,2, Yuri Kaganovskii3

  • 1Institute for Nuclear Research, H-4026 Debrecen, Bem Tér 18/C, Hungary.

Heliyon
|February 9, 2024
PubMed
概括

原子通过铜粒边界迁移,在表面形成岛屿. 这项研究使用先进的光谱技术量化了铜膜中的扩散.

关键词:
在Cu/Si纳米层中.谷物边界扩散的扩散低能离子散射是一种低能离子散射.纳米晶体Cu Cu 的使用.纳米尺度的扩散.

更多相关视频

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens07:15

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Published on: June 2, 2017

9.3K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.6K

相关概念视频

Metallic Solids02:37

Metallic Solids

Metallic solids such as crystals of copper, aluminum, and iron are formed by metal atoms. The structure of metallic crystals is often described as a uniform distribution of atomic nuclei within a “sea” of delocalized electrons. The atoms within such a metallic solid are held together by a unique force known as metallic bonding that gives rise to many useful and varied bulk properties.
All metallic solids exhibit high thermal and electrical conductivity, metallic luster, and malleability. Many...