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Growth and Electrostatic/chemical Properties of Metal/LaAlO3/SrTiO3 Heterostructures
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在CaTiO_{3}表面的铁弹性双角通过光发射电子显微镜量化

G Magagnin1, C Lubin1, M Escher2

  • 1SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France.

Physical review letters
|February 16, 2024
PubMed
概括

研究人员使用光发射电子显微镜测量了CaTiO3表面上的铁弹性双壁角. 这种技术量化了应变排序和双角度,揭示了有关矿铁弹性的细节.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...