:ADFSTEM,

D G Şentürk1, A De Backer1, S Van Aert1

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Ultramicroscopy
|February 22, 2024
PubMed
概括

这项研究引入了一种使用环状暗场扫描传输电子显微镜 (ADF STEM) 精确计数异质纳米粒子中的原子的新方法. 这种技术为分析光束敏感纳米材料提供了一种剂量高效的替代方案.

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