一种基于Si的新型MOSFET用于辐射增强
Weifeng Liu1,2, Zhirou Zhou1, Dong Zhang1
1State Key Discipline Laboratory of Wide Band-Gap Semiconductor Devices and Integrated Technology, School of Microelectronics, Xidian University, Xi'an 710071, China.
Micromachines
|February 24, 2024
概括
这项研究通过修改设备结构以减少单事件效应 (SEE) 期间的电荷收集来提高N通道金属氧化物半导体场效应晶体管 (NMOSFET) 的辐射抵抗. 拟议的设计大大降低了泄漏电流,并提高了驱动电流的性能.
科学领域:
- 半导体物理 半导体物理
- 电子产品中的辐射效应.
背景情况:
- 单一事件效应 (SEE) 对半导体设备的可靠性构成重大威胁,特别是N型金属氧化物半导体场效应晶体管 (NMOSFET).
- 漂移在敏感区域的作用对于确定SEE期间的电荷收集效率至关重要.
- 现有的NMOSFET设计容易发生电荷泄漏,影响其抗辐射能力.
研究的目的:
- 分析NMOSFETs敏感区域中漂移的作用.
- 通过新的设备结构设计,增强NMOSFETs的单粒子辐射抗性.
- 为了减轻电荷收集和改善在辐射下驱动电流的性能.
主要方法:
- 在NMOSFETs敏感区域的漂移分析.
- 一个基于Si的装置结构的建议,扩展轻度杂的源-排水区域.
- 开发一种复合金属氧化物半导体 (MOS) 结构,具有 pn 结和两个电荷路径.
- 在各种辐射条件下模拟SEE,包括不同的线性能量转移 (LET) 值和冲击角度.
主要成果:
- 拟议的NMOSFET设计在标准照射下减少了15.69%的收集电荷.
- 复合MOS结构进一步降低了13.85%的泄漏收集费用.
- 复合MOS结构显示,在LET值在0.2到1 pC/μm之间的情况下,排水收集负荷 (14.65%) 均降低.
- 在特定的发射位置和角度观察到的最大电荷减速率分别为28.23%和17.12%.
结论:
- 新型设备结构有效地调节敏感区域的电场,增强辐射电阻.
- 复合MOS结构在减少电荷收集和减轻驱动电流恶化方面提供了卓越的性能.
- 该设备在各种条件下对一次性辐射具有强大的抵抗力.
相关概念视频
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