对于双轴电光测量设备的目标测量误差的活性补偿技术
Lintao Lan1,2, Fangwu Hua2, Fang Fang2
1State Key Laboratory of Intelligent Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
Sensors (Basel, Switzerland)
|February 24, 2024
概括
本研究引入了一种主动补偿技术,以减少双轴电光测量设备中的随机误差. 辐射基函数神经网络 (RBFNN) 方法在提高测量精度方面被证明是最有效的.
科学领域:
- 光电学是指光电子产品.
- 测量科学 测量科学 测量科学
- 控制系统工程 控制系统工程
背景情况:
- 双轴电光测量设备因制造,组装,传感器和校准不准确而存在随机错误.
- 这些错误会扩散并降低目标测量结果的精度.
研究的目的:
- 提出一种主动补偿技术,以减轻随机测量错误.
- 为了提高双轴电光测量系统的整体精度.
主要方法:
- 对设备的错误形成机制进行了调查,并建立了错误传输模型.
- 开发并比较了三个补偿方法:最小平方 (LS),自适应卡尔曼波器 (AKF) 和辐射基函数神经网络 (RBFNN).
主要成果:
- 理论分析和数值模拟确定了RBFNN方法是最优的.
- 通过RBFNN方法,RBFNN表现出其在近似随机误差表面的卓越能力,以获得精确的补偿.
- 实验验证证了主动补偿技术的有效性.
结论:
- 提出的主动补偿技术,特别是使用RBFNN,显著提高了测量精度.
- 基于RBFNN的方法提供了一个精确的方法,用于电光系统的错误补偿.
- 该技术经过工程应用性验证,并提高了测量精度.
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