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Updated: Jul 2, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
09:49

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

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在TEM操作下,用于电气偏移的板块的无接安装

Oscar Recalde-Benitez1, Yevheniy Pivak2, Tianshu Jiang1

  • 1Advanced Electron Microscopy Division, Institute of Materials Science, Technische Universität Darmstadt, Peter-Grünberg-Straße 2, Darmstadt 64287, Germany.

Ultramicroscopy
|February 24, 2024
PubMed
概括

一种新的聚焦离子束 (FIB) 样品制备方法使金属绝缘体金属 (MIM) 装置在传输电子显微镜 (TEM) 中进行现场电测. 这种技术确保了用于纳米尺度设备表征的良好的电气连接.

关键词:
基于FIB的样本准备方法在现场TEM偏差偏差.基于MEMS的芯片可以使用.在 MIM 设备中,MIM 设备是非常重要的.

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