,X线

Haozhe Liu, Longchao Guo1, Zhenzhen Cui2

  • 1School of Mechanical Engineering, Institute for Advanced Materials, Deformation and Damage from Multi-Scale, Chengdu University, Chengdu 610106, China.

Nano letters
|February 29, 2024
PubMed
概括

研究人员使用NaLuF4:Tb3+纳米晶体中的离子替代增强了X射线辐射信息存储. 这一突破提高了先进的X射线成像和剂量测量应用的记忆能力.