相关实验视频

Updated: Jul 26, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K

在增材制造的TiC-Fe基陶上,EBSD对微观结构和微观结构演变的调查-多重激光扫描的影响

H S Maurya1, R J Vikram2, R Kumar3

  • 1Department of Mechanical and Industrial Engineering, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia; Luleå University of Technology, Department of Engineering Sciences and Mathematics, Luleå SE-97187, Sweden.

Micron (Oxford, England : 1993)
|March 1, 2024
PubMed
概括

使用激光粉床化 (L-PBF) 优化了碳化铁 (TiC-Fe) 陶的增材制造. 降低激光扫描速度通过增加高角粒边界来增强柔性,从而导致没有裂纹的组件.

关键词:
增材制造 增材制造是一种增材制造.电子反射散射器的折射差异是电子的反射差异.激光粉末床融合激光粉末床融合微观结构的表征.基于TiC的陶材料可以使用.

更多相关视频

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

2.6K
Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide09:44

Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide

Published on: May 23, 2025

54

相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...