相关实验视频

Updated: Jun 22, 2026

Formation of Thick Dense Yttrium Iron Garnet Films Using Aerosol Deposition
10:52

Formation of Thick Dense Yttrium Iron Garnet Films Using Aerosol Deposition

Published on: May 15, 2015

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在化薄膜中Sc和Y离子的局部环境

Asaf Cohen1, Junying Li2, Hagai Cohen3

  • 1Department of Molecular Chemistry and Materials Science, Weizmann Institute of Science, Rehovot 7610001, Israel.

ACS applied electronic materials
|March 4, 2024
PubMed
概括

和离子在AlN薄膜中替代,采用四面体协调. 在较高度下,一些离子转移到八面体协调.

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors12:32

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

Published on: May 24, 2020

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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