概括
这项研究展示了使用光子学进行光学控制的信号处理. 它使用不同的光波长进行数据和控制,从而实现高效的振幅调制和序列检测.
科学领域:
- 光子学和光学工程 光子学和光学工程
- 集成电路 集成电路
- 信号处理 信号处理
背景情况:
- 传统的信号处理通常依赖于电气控制,这种控制可以受到带宽和功耗的限制.
- 光子学为高速光学信号处理提供了一个有前途的平台,因为它与现有的半导体制造相兼容.
- 有效的光学控制机制对于推进集成光子系统至关重要.
研究的目的:
- 在商业光学集成电路 (IC) 工艺中演示光学偏差和控制的信号处理.
- 展示使用波长分割多重复合 (WDM) 来传输单独的数据和控制信号.
- 为了实验验证两个特定的应用:一个振幅调制器和一个双点击序列探测器.
主要方法:
- 使用商业光子造工艺制造集成电路.
- 采用波长分割多重复合 (WDM) 来分离光数据和控制信号.
- 将光学控制信号转换为电压,使用在光导模式下运行的串联叠加光二极管.
主要成果:
- 一个振幅调制器被证明,只需要0.25mW的光学控制功率来实现15dB的光学输出功率调范围.
- 一个双点击序列探测器成功实现,能够将各种调制格式 (OOK,PAM-3,PAM-4) 的符号映射到不同的级别.
- 序列探测器需要最多5mW的光学控制功率进行校准和偏差.
结论:
- 使用标准的光子IC工艺,光学控制的信号处理是可行的和高效的.
- 展示的方案为像振幅调制和序列检测这样的关键功能提供了低光学控制功率要求.
- 拟议的方法可扩展,用于检测更长的序列,并支持未来光子系统中更复杂的调制格式.
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