对芯片和共振器设计进行多物理分析,以提高外腔高功率激光二极管的损伤值
Optics express
|March 5, 2024
概括
这项研究分析了高功率激光二极管中的灾难性光学损伤 (COD). 新型芯片设计和共振器修改显著增加了输出功率,并防止了反诱导的故障.
科学领域:
- 光电学是指光电子产品.
- 半导体设备 半导体设备
- 激光物理 激光物理
背景情况:
- 高功率激光二极管对于各种应用至关重要.
- 灾难性的光学损坏 (COD) 限制了它们的性能和可靠性.
- 外部光学反,特别是在错位的情况下,可以触发COD.
研究的目的:
- 为了评估高功率激光二极管中灾难性光学损伤 (COD) 的门.
- 调查不同芯片设计和外部共振器修改对COD的影响.
- 分析设计改进,电光效率和光束质量之间的权衡.
主要方法:
- 进行了详细的多物理模拟.
- 分析了三种不同的芯片设计:非注射镜,非吸收镜和能量屏障波导.
- 研究了一种修改后的外部共振器设计,以减少错位灵敏度.
主要成果:
- 与初始设计相比,芯片设计概念显示出增加输出功率的潜力 (8%,27%,27%).
- 修改后的外部共振器设计有效地防止了反引起的故障.
- 分析了COD值对设计参数 (如带隙变化和焦距变化) 的依赖.
结论:
- 新型芯片设计为激光二极管的可实现输出功率提供了显著的改进.
- 外部共振器修改提供了针对反诱导的COD的强有力的解决方案.
- 这些进展对于提高高功率激光二极管的可靠性和性能至关重要.
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