从被动光子集成电路的基带带限的S参数中提取因果冲动响应,用于时间域模拟
Optics express
|March 5, 2024
概括
本研究提出了一种方法,将被动光子集成电路 (PIC) 的S参数转换为时间域表示. 这种方法可以确保对复杂的PIC进行准确和因果模拟.
科学领域:
- 光子学 是一个光子学.
- 集成光学 集成光学 集成光学
- 计算电磁学 计算机电磁学
背景情况:
- 被动光子集成电路 (PIC) 呈现由S参数描述的波长依赖的行为.
- 电路级模拟通常需要时间域分析,需要从S参数转换.
- 现有的方法可能难以准确或违反诸如因果关系之类的物理性质.
研究的目的:
- 开发一种准确和可靠的方法,用于将被动PIC的S参数转换为时间域.
- 提取因果冲动反应对于时间域模拟至关重要.
- 为了能够准确模拟包含被动和主动组件的PIC.
主要方法:
- 基带,带限 S-参数的推断.
- 将频域S参数转换为时间域冲动响应.
- 在提取的反应中确保因果关系和物理准确性.
主要成果:
- 从被动的PIC S参数中提取因果冲动反应的高效和强大的方法.
- 成功地将S参数转换为具有物理意义的时间域表示.
- 在广泛的被动PIC设计中证明了适用性.
结论:
- 拟议的方法有效地解决了PICs的时间域模拟的挑战.
- 准确的因果冲动反应提取对于模拟复杂的光子电路至关重要.
- 这种技术可促进更全面,更可靠的PIC设计和分析.
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