Nan Qi1, Yan Piao1, Hao Zhang1

  • 1Department of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun, China.

概括

这项研究引入了Sel-JPM-ViT,这是一种使用较少电脑电图 (EEG) 通道预测发作的新方法. 视觉变压器模型有效地选择关键通道,提高可穿戴设备的预测准确度.