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纳米天线与脱的透明线索用于光电子研究

Melanie Sommer1, Florian Laible1, Kai Braun2

  • 1Institute for Applied Physics and Center LISA+, University of Tübingen, Tübingen, Germany.

Nanotechnology
|March 8, 2024
PubMed
概括

这项研究提出了一种新的方法,用于在单个等离子纳米结构上使用氧化导电进行电气测量. 这种技术克服了与纳米结构接触的挑战,而不会改变它们的光学特性.

关键词:
蝶结领带天线天线印度锡氧化物 锡氧化物纳米制造的纳米制造光电子产品的光电子产品塑制剂的使用方法

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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