在Xe 4d电离后的双奥格-迈特纳衰变的时间解析多电子巧合光谱
Pengju Zhang1, Joel Trester1, Kiyoshi Ueda1,2,3
1Laboratory for Physical Chemistry, ETH Zürich, Vladimir-Prelog-Weg 2, 8093 Zürich, Switzerland.
Physical review letters
|March 8, 2024
概括
我们开发了具有时间分辨率的多电子巧合光谱法,以研究双奥格-迈特纳 (AM) 辐射. 这种技术测量了中间Xe^{2+*}状态的寿命为109±22 fs.
科学领域:
- 原子和分子物理 原子和分子物理
- 量子光学是一种量子光学.
- 频谱学是一种光谱学.
背景情况:
- 奥格-迈特纳 (AM) 衰变是原子物理学中的一个基本过程.
- 了解多电子发射级联对于描述原子放松动态至关重要.
- 以前的方法缺乏完全解开复杂衰变路径的分辨率.
研究的目的:
- 引入和验证时间解析的多电子巧合光谱学.
- 为了研究4d光离子化后在中发生的双重奥格-迈特纳 (AM) 发射过程.
- 测量中间状态X^{2+*}状态的使用寿命.
主要方法:
- 使用磁瓶飞行时间谱仪进行巧合测量.
- 采用时间解析的多电子巧合光谱学.
- 使用单个近红外 (NIR) 光子吸收探测了中间的 Xe^{2+*} 状态.
主要成果:
- 成功分配了涉及两个AM电子排放的完整级联路径.
- 测量了中间 Xe^{2+*} 状态的寿命为 (109±22) fs.
- 证明了新的光谱技术的能力.
结论:
- 时间解析的多电子巧合光谱学为原子衰变过程提供了前所未有的洞察力.
- 测量的寿命为自电离的理论模型提供了关键数据.
- 这种技术为研究原子和分子中的超快动态开辟了新的途径.
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