射线计算机断层扫描仪表性能评估,第三部分:对不同放大度的探测器几何和旋转阶段错误的灵敏度
Prashanth Jaganmohan1,2, Bala Muralikrishnan1, Meghan Shilling1
1Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
概括
这项研究调查了X射线计算机断层扫描 (XCT) 系统中的几何错误,重点关注探测器和旋转阶段的定位,以提高放大和错误灵敏度. 最佳的位置可以提高工业计量学的性能评估.
科学领域:
- 计量学 计量学 计量学
- 工业检查 工业检查 工业检查
- 射线计算机断层扫描 (XCT) 是指X射线计算机断层扫描.
背景情况:
- 射线计算机断层扫描 (XCT) 在工业计量学中越来越多地用于检查微妙和复杂的部件.
- 标准化性能评估对于比较XCT仪器和确保计量可追溯性至关重要.
- 现有的标准 (ASME B89.4.23) 和正在进行的ISO工作解决了对可靠XCT性能评估的需求.
研究的目的:
- 通过分析探测器和旋转阶段定位对放大效应,扩展先前对XCT几何误差的研究.
- 确定探测器和旋转阶段的最佳位置,以最大限度地敏感于特定的几何错误.
- 为 XCT 绩效评估制定可靠的文档标准作出贡献.
主要方法:
- 研究了与 XCT 仪器探测器和旋转阶段相关的几何错误.
- 通过考虑探测器的不同位置和旋转阶段来分析放大效应,扩展了先前的研究.
- 评估了最佳的阶段和探测器位置,以提高错误灵敏度.
主要成果:
- 探测器和旋转阶段的位置显著影响XCT系统中的放大.
- 确定了特定的位置,以最大限度地提高探测器和旋转阶段几何错误的灵敏度.
- 这项研究为开发更敏感的绩效评估测试提供了基础.
结论:
- 变化探测器和旋转阶段的位置对于理解和减轻XCT中的几何错误至关重要.
- 最佳的组件放置可以提高性能评估测试的灵敏度,从而导致更可靠的计量学.
- 这项工作支持 XCT 性能验证的国际标准的制定.
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