用于辐射检测的宽带间隙半导体:一篇评论
1Ruđer Bošković Institute, Bijenička 54, 10000 Zagreb, Croatia.
Materials (Basel, Switzerland)
|March 13, 2024
概括
像4H-SiC和GaN这样的宽带间隙 (WBG) 半导体在检测α粒子和中子方面表现出色. 贝塔氧化物 (β-Ga2O3) 显示出对X射线检测的希望,尽管它不那么成熟.
科学领域:
- 材料科学 材料科学 材料科学
- 半导体物理 半导体物理
- 核仪器仪表 核仪器仪表 核仪器仪表
背景情况:
- 宽带间隙 (WBG) 半导体晶片制造的进步刺激了新的设备应用.
- WBG 半导体具有独特的性能,适用于苛刻的环境.
- 辐射检测是一个关键领域,正在进行材料研究.
研究的目的:
- 提供WBG半导体用于辐射检测的概述.
- 描述常见的WBG材料及其在辐射检测中的应用.
- 突出WBG设备最近的成就和未来的潜力.
主要方法:
- 对WBG半导体用于辐射检测的现有文献的审查.
- 设备类型的描述包括4H-SiC,GaN和β-Ga2O3.
- 对检测各种辐射类型 (α,中子,X射线) 的性能进行分析.
主要成果:
- 4H-SiC和GaN装置在检测α粒子和中子,特别是热中子方面表现出色.
- 虽然β-Ga2O3设备在技术上不那么成熟,但在X射线检测方面具有显著的潜力.
- WBG半导体正在使下一代辐射探测器成为可能.
结论:
- 对于各种辐射检测应用,WBG半导体非常有前途.
- 4H-SiC和GaN是粒子和中子检测的成熟技术.
- β-Ga2O3为X射线检测提供了强大的未来前景.
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