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Updated: Jul 1, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
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Published on: July 30, 2013

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原子纳米结构在金属表面的静电潜力通过扫描量子点显微镜量化

Rustem Bolat1,2,3, Jose M Guevara1, Philipp Leinen1

  • 1Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425, Jülich, Germany.

Nature communications
|March 14, 2024
PubMed
概括

研究人员对银和金纳米结构的静电潜力进行了成像,揭示了双极形成的洞察力. 这项工作为理论提供了基准,并有助于设计纳米级系统,如单原子催化剂.

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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM08:31

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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