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Updated: Jun 29, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

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多刺激运行传输电子显微镜用于基于氧化物的双终端设备.

Oscar Recalde-Benitez1, Yevheniy Pivak2, Robert Winkler1

  • 1Advanced Electron Microscopy Division, Institute of Materials Science, Department of Materials and Geosciences, Technische Universität Darmstadt, Peter-Grünber-strasse 2, Darmstadt 64287, Germany.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|March 25, 2024
PubMed
概括

微电子机械系统 (MEMS) 芯片使纳米电子设备的现场传输电子显微镜 (TEM) 研究成为可能. 一种新的技术揭示了再氧化在离子/电子轰炸后降低了memristor和电容器的泄漏电流.

关键词:
在现场的TEM.在FIB上,FIB就是FIB.在MEMS MEMS中使用.纳米细胞反应堆中的反应器.纳米电子学纳米电子学清洁等离子体清洗

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相关概念视频

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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