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三门场效应晶体管的温度依赖反操作
Taeho Park1, Kyoungah Cho1, Sangsig Kim1
1Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of Korea.
Nanomaterials (Basel, Switzerland)
|March 27, 2024
概括
三门反场效应晶体管 (TG FBFETs) 显示了取决于温度的启动电压变化. 这些设备在广泛的温度范围内保持理想的开关特性,在更高的温度下拥有更宽的内存窗口.
科学领域:
- 半导体设备物理学 半导体设备物理
- 固态电子产品的固态电子
- 材料科学是一种材料科学.
背景情况:
- 三门反场效应晶体管 (TG FBFET) 是现代电子产品中至关重要的组件.
- 了解它们在不同温度下的电气特性对于可靠的设备操作至关重要.
研究的目的:
- 为了研究TG FBFETs的电特性.
- 分析温度 (-200°C至280°C) 对其性能的影响,特别是锁电压和开关特性.
主要方法:
- 对TG FBFETs的实验性表征.
- 在广泛的温度范围内进行的电气测量.
- 分析上锁电压,下值波动和内存窗口变化.
主要成果:
- 由于电荷载体度的变化,随着温度的变化,拉切电压发生显著的变化.
- 观察到理想的下值波动 (n通道的6.6mV/dec,p通道的7.2mV/dec).
- 随着温度的增加,内存窗口会扩大,超过3.05V (n频道) 和1.42V (p频道) 在85°C以上.
结论:
- TG FBFET 显示出强大的开关特性,尽管温度引起的上锁电压变化.
- TG FBFET 的温度依赖性行为为温度敏感的应用程序和内存设备提供了潜力.
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