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Updated: Apr 13, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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在二维过渡金属二二甲基化物中对moiré转换的原子对原子成像

Yichao Zhang1, Ji-Hwan Baek2, Chia-Hao Lee1

  • 1Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL 61801, USA.

Science advances
|March 27, 2024
PubMed
概括

原子对原子的成像揭示了扭曲的双层二维材料如何通过谷物核和缺陷跳跃将moiré超级网格局部转换为对齐的域,从而提供了对接口控制的见解.

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