Emmanuel Bender1,2, Joseph B Bernstein2, Duane S Boning1

  • 1Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA 02142, USA.

Micromachines
|March 28, 2024
PubMed
概括

本综述总结了微电子包装可靠性趋势,从电线结合和BGA到先进的3D堆叠和互连织物集成以实现异质集成 (HI). 它探讨了设计和验证方法,为未来的HI包装挑战提出了优化测试的建议.