基于机器学习的SIPOS调制漂移区域U-MOSFET的优点模型
Zhen Cao1,2, Qi Sun1,2, Chuanfeng Ma1,2
1School of Artificial Intelligence, Xidian University, Xi'an 710126, China.
Micromachines
|March 28, 2024
概括
本研究介绍了一种机器学习模型,用于模块化漂移区域的超连接 (SJ) U-MOSFET. 该模型优化了故障电压和ON电阻之间的权衡,超过了极限.
科学领域:
- 电力电子 电力电子 电力电子
- 半导体设备 半导体设备
- 材料科学 材料科学 材料科学
背景情况:
- 超连接 (SJ) U-MOSFET对于高压应用至关重要.
- 优化故障电压 (BV) 和特定ON电阻 (R_on) 之间的权衡是一个关键挑战.
- 现有的模型可能无法完全捕捉模块化漂移区域中的复杂相互作用.
研究的目的:
- 为SJ U-MOSFETs与调制漂移区域开发基于机器学习的优点图 (FOM) 模型.
- 为了优化故障电压 (BV) 和特定ON电阻 (R_on) 的权衡.
- 在设备性能方面超越SJ极限.
主要方法:
- 使用半绝缘多晶 (SIPOS) 支柱来调节SJ漂移区域.
- 开发一个分析模型,考虑电场调制,电荷合和载体积累.
- 采用高斯过程回归用于FOM预测和超参数优化.
- 与 TCAD 模拟结果对模型进行验证.
主要成果:
- 一个强大的机器学习模型用于预测SSJ-UMOSFET的FOM (BV^2/R_on).
- 确定漂移区域,氧化物厚度和电场调制的最佳结构参数.
- 展示了一种方法来实现BV-R_on的权衡,超过SJ极限.
- 使用 TCAD 模拟进行模型的全面验证.
结论:
- 拟议的机器学习模型准确地预测了模块化漂移区域的SJ U-MOSFET的性能.
- 该方法允许设计具有优越BV-R_on特性的设备.
- 这项工作有助于推进高性能功率半导体设备.
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