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Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Shengtong Wang1, Rui Ma1, Feifan Cao1
1Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, China.
精确的角度测量对于高端制造至关重要. 本综述详细介绍了单轴和多轴光学,机械和人工智能辅助方法,以指导各种制造需求的技术选择.
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