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Updated: Jun 29, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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调节MoS2场效应晶体管接口的分子协调策略

Yu Luo, Huiqiang Lu, Jingwen Huang

    Journal of the American Chemical Society
    |March 28, 2024
    PubMed
    概括

    现在可以在不损坏晶体的情况下用有机分子化学修饰二维过渡金属二化物 (TMD). 这种新的协调结合方法提高了单层MoS2场效应晶体管 (FET) 的电子性能和设备性能.

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    A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics07:12

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