Atomic Force Microscopy
Overview of Microscopy Techniques
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Peng Cheng1, Yingzi Li2, Rui Lin1
1School of Physics, Beihang University, Beijing 100191, China.
这项研究介绍了一种适应性低采样策略,用于压缩感应原子力显微镜 (CS-AFM). 这种方法优化了对感兴趣区域的采样,提高了图像质量,并加快了原子力显微镜成像的速度.
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14:13Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
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