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Updated: Jul 23, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

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调查Si和Ge中由100keVAr+离子束诱导的波纹模式形成和损伤概况:一项比较研究

Indra Sulania1,2, Harpreet Sondhi3,4, Tanuj Kumar5

  • 1Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India.

Beilstein journal of nanotechnology
|April 9, 2024
PubMed
概括

能量离子束在 (Si) 和 (Ge) 表面上产生纳米级的波纹图案. 这项研究详细介绍了模式形成和缺陷分析,揭示了波纹波长对离子流动的依赖.

关键词:
拉瑟福向后散射光谱学原子力显微镜的原子力显微镜.离子束的离子束.纳米模式的使用辐射损伤 辐射损伤传输电子显微镜的使用

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Spark Plasma Sintering Apparatus Used for the Formation of Strontium Titanate Bicrystals11:17

Spark Plasma Sintering Apparatus Used for the Formation of Strontium Titanate Bicrystals

Published on: February 9, 2017

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Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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