对样本形态学对近区域-轴融合束电子衍射模式的影响的观察
Xiaofen Tan1,2, Laure Bourgeois1,3, Philip N H Nakashima1
1Department of Materials Science and Engineering, Monash University, Victoria 3800, Australia.
概括
电子衍射模式中的对称性断裂揭示了样品的形状,而不仅仅是原子结构. 这使得在合金等材料中使用聚变束电子衍射 (CBED) 来推断纳米尺度形态.
科学领域:
- 材料科学 材料科学 材料科学
- 晶体学 晶体学是指结晶学.
- 电子显微镜电子显微镜
背景情况:
- 融合束电子衍射 (CBED) 是分析晶体结构的强大技术.
- 解释CBED模式通常依赖于单元细胞的对称性.
- 标本形态学可以影响衍射模式,但这往往被忽视.
研究的目的:
- 为了调查由样本形态学引起的CBED模式中的对称性断裂.
- 为了证明样本对称性,而不仅仅是单元细胞对称性,决定了CBED模式强度分布.
- 建立一种方法来从CBED模式中推断纳米级形态信息.
主要方法:
- 从具有纳米尺度空隙的-铜-锡合金中分析近区域轴CBED图案.
- 基于多切片理论的几何论证的应用.
- 检查CBED模式,其中电子束与空隙面在非垂直角度相互作用.
主要成果:
- 在CBED强度分布中观察到的对称性断裂不能仅靠单元细胞对称性来解释.
- 直接将观察到的对称性归因于矩阵内的纳米尺度空隙的形态.
- 通过样本几何学和多切理论成功解释了衍射模式对称性.
结论:
- CBED模式可以提供关于标本形态的信息,特别是在光束方向 (第三维).
- 样品形状和空隙对称性在确定CBED模式特征方面发挥着至关重要的作用.
- 这项技术提供了一种新的方法,用于使用传输电子显微镜对材料中纳米尺度特征进行表征.
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