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Updated: Jun 28, 2025

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

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基于CBG-YOLOv5s的金属表面腐蚀的检测和识别

Mingjiao Fu1, Zhitong Jia1, Lingzhi Wu2

  • 1School of Computer and Control Engineering, Yantai University, Yantai, China.

PloS one
|April 10, 2024
PubMed
概括

这项研究引入了一种新的CBG-YOLOv5s模型,用于检测金属表面腐蚀,显著提高沿海结构的精度和速度. 先进的模型增强了特征表示和小目标检测,以更好地进行结构安全评估.

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Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
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The degradation of metals due to natural electrochemical processes is known as corrosion. Rust formation on iron, tarnishing of silver, and the blue-green patina that develops on copper are examples of corrosion. Corrosion involves the oxidation of metals. Sometimes it is protective, such as the oxidation of copper or aluminum, wherein a protective layer of metal oxide or its derivatives forms on the surface, protecting the underlying metal from further oxidation. In other cases, corrosion is...
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