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Van-Thuc Nguyen1, Vo Thi Thu Nhu2, Xuan-Tien Vo1

  • 1Faculty of Mechanical Engineering, HCMC University of Technology and Education, Ho Chi Minh City, 70000, Viet Nam.

概括

分子动力学模拟显示,在爆炸性接过程中,较高的冲击速度和深度会增加Cu-Ta接头的残余应力和最终抗拉强度 (UTS). 最佳定位增强了UTS,深度显著影响了关节特性.