通过基于MUX的建模和设计,通过使用QCA单元的对称性来优化RAM单元的故障耐受性

Syed Farah Naz1, Suhaib Ahmed2, Shafqat Nabi Mughal3

  • 1Department of Electrical Engineering, Indian Institute of Technology, Jammu, India.

Scientific reports
|April 13, 2024
PubMed
概括

本研究介绍了一种高效的随机存取内存 (RAM) 细胞,使用量子点细胞自动机 (QCA) 技术. 这种新的设计为先进的电子产品提供了量子成本和超低功耗的显著改进.

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