根通道牙在最后灌时会磨损,在带有被动超声波灌和易于清洁的仪器的内牙科再处理中,最终灌时会磨损

Louise Schmitt Alves1, Fabiola Ormiga1, Carolina Oliveira de Lima2

  • 1Department of Dental Clinic, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil.

概括

被动超声波灌 (PUI) 和易于清洁 (EC) 仪器在内牙科再处理过程中导致牙磨损. 该EC仪器导致了更大的尖端磨损,特别是AH Plus和Total Fill密封器,需要谨慎使用.