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Updated: Jun 28, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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用电子束进行软触摸:利用先进的扫描低能电子显微镜与深度学习相结合,挖掘纳米材料的结构信息

Eliška Materna Mikmeková1, Jiří Materna2, Ivo Konvalina1

  • 1Institute of Scientific Instruments of the Czech Academy of Sciences, Královopolská 147, 612 64 Brno, Czech Republic.

Ultramicroscopy
|April 19, 2024
PubMed
概括

扫描低能电子显微镜 (SLEEM) 与深度学习相结合,提供高分辨率的纳米级材料分析. 这种可访问的技术提供了更清晰的结构和表面信息,没有样品涂层,克服了传统方法的局限性.

关键词:
深度学习是一种深度学习.半孔的二氧化.扫描低能电子显微镜扫描技术

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