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Updated: Jun 28, 2025

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
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Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

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通过光发射电子显微镜研究的PdSe2的依赖层的超快速载体动力学

Xiaying Lyu1, Yaolong Li1, Xiaofang Li1

  • 1State Key Laboratory for Mesoscopic Physics & Department of Physics, Collaborative Innovation Center of Quantum Matter and Frontiers Science Center for Nano-optoelectronics, Beijing Academy of Quantum Information Sciences, Peking University, Beijing 100871, China. yaolong@pku.edu.cn.

Nanoscale
|April 24, 2024
PubMed
概括

层厚度会影响二维材料的性能. 二化 (PdSe2) 中的超快载体动力学揭示了不同的半导体和半金属阶段行为,在较薄的层中缺陷捕获显著.

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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